Analysis Lab.
Analysis Lab.
□ GDOES
- Depth profile analysis of the atomic composition of conducting materials
- Fast sputtering rate, high depth resolution, excellent sensitivity and multi-element capability
- Sample size : < 20 × 20 mm2
□ Nano Indenter
- Measurement of mechanical properties (hardness, Young’s modulus) of materials
- Small volumes of material, small indentation area (~ μm2)
- Sample size : < 30 × 30 mm2
□ AFM
- Analysis of surface morphology by using contact mode
- High resolution (~ nm)
- Sample size : ~ 10 × 10 mm2
□ FTIR
- Analysis of chemical bonding or molecular structure of materials, whether organic or inorganic in vacuum
- Sample size : > 10 × 10 mm2
□ Image Analyzer
- Image editing, enhancement and analysis tool
- Resize, crop images, filters, conversion and transformations (color model conversion, distance, Fourier)
□ SEM & EDS
- Observation of magnified images by using electrons instead of light waves
- Analysis of elemental and chemical characterization
- Higher magnification, larger depth of focus, greater resolution
- Sample size : < 30 × 30 mm2
□ Wetting Angle Analysis
- Analysis of interfacial energy by measuring contact angle which is formed between the liquid/solid interface and the liquid/vapor interface
- Sample size : > 10 × 10 mm2
□ 4 Point Probe
- Measurement of resistivity of any semiconductor material either bulk or thin film
- Sample size : > 15 × 15 mm2
□ Hall Measurement
- Measurement of sheet carrier density, bulk carrier density n or p, hall mobility and resistivity
- Sample size : 10 × 10 mm2
□ Stress Tester
- Measurement of residual stress in thin film
- Sample size: specific thin wafer (5 × 70 mm2) for measuring stress
□ Alpha Step Surface Profiler
- Measurement of film thickness
- Surface profiler (0.1 % step height repeatability and sub-angstrom resolution)
□ Peel Tester
- Measurement of strength required to pull apart a bonded surface (adhesion between film and substrate)
- Sample size : 10 × 40 mm2
□ Scratch Tester
- Characterization of the surface mechanical properties of thin films and coatings (adhesion, fracture and deformation)
- Sample size : 20 × 20 mm2
□ Phase Contrast Microscope
- Optical microscopy illumination technique in which small phase shifts in the light passing through a transparent specimen are converted into ampitude or contrast changes in the image
□ Solar Simulator
- Production of highly collimated, very uniform output beam in various sizes (2x2, 4x4, 6x6 and 8x8 inches)
□ UV-Visible Spectrometer
- Reflectivity and transmittance of solid samples such as glass and a film can be measured, covering a wavelength range from ultraviolet to near infrared
- Sample size : 25 × 75 mm2
□ V-I Probe
- Method of fault detection of plasma discharge and monitoring plasma parameter
□ Spectrophotometer
- Device for measureing light intensity
- Measurement of intensity as a function of the light source wavelength (spectral bandwidth and linear range of absorption)
□ Thermal Properties Analyzer
- Transient line heat source method to measure thermal diffusivity, specific heat (heat capacity), thermal conductivity, and thermal resistivity
□ Centrifuge
- Isolation of small volumes of biological molecules or cells (prokaryotic and eukaryotic)


GDOES
- Depth profile analysis of the atomic composition of conducting materials
- Fast sputtering rate, high depth resolution, excellent sensitivity and multi-element capability
- Sample size : < 20 × 20 mm2


Nano Indenter
- Measurement of mechanical properties (hardness, Young’s modulus) of materials
- Small volumes of material, small indentation area (~ μm2)
- Sample size : < 30 × 30 mm2


AFM
- Analysis of surface morphology by using contact mode
- High resolution (~ nm)
- Sample size : ~ 10 × 10 mm2


FTIR
- Analysis of chemical bonding or molecular structure of materials, whether organic or inorganic in vacuum
- Sample size : > 10 × 10 mm2


Image Analyzer
- Image editing, enhancement and analysis tool
- Resize, crop images, filters, conversion and transformations (color model conversion, distance, Fourier)


SEM & EDS
- Observation of magnified images by using electrons instead of light waves
- Analysis of elemental and chemical characterization
- Higher magnification, larger depth of focus, greater resolution
- Sample size : < 30 × 30 mm2


Wetting Angle Analysis
- Analysis of interfacial energy by measuring contact angle which is formed between the liquid/solid interface and the liquid/vapor interface
- Sample size : > 10 × 10 mm2


4 Point Probe
- Measurement of resistivity of any semiconductor material either bulk or thin film
- Sample size : > 15 × 15 mm2


Hall Measurement
- Measurement of sheet carrier density, bulk carrier density n or p, hall mobility and resistivity
- Sample size : 10 × 10 mm2


Stress Tester
- Measurement of residual stress in thin film
- Sample size: specific thin wafer (5 × 70 mm2)for measuring stress


Alpha Step Surface Profiler
- Measurement of film thickness
- Surface profiler (0.1 % step height repeatability and sub-angstrom resolution)


Peel Tester
- Measurement of strength required to pull apart a bonded surface (adhesion between film and substrate)
- Sample size : 10 × 40 mm2


Scratch Tester
- Characterization of the surface mechanical properties of thin films and coatings (adhesion, fracture and deformation)
- Sample size : 20 × 20 mm2


Phase Contrast Microscope
- Optical microscopy illumination technique in which small phase shifts in the light passing through a transparent specimen are converted into ampitude or contrast changes in the image


Solar Simulator
- Production of highly collimated, very uniform output beam in various sizes (2x2, 4x4, 6x6 and 8x8 inches)


UV-Visible Spectrometer
- Reflectivity and transmittance of solid samples such as glass and a film can be measured, covering a wavelength range from ultraviolet to near infrared
- Sample size : 25 × 75 mm2


V-I Probe
- Method of fault detection of plasma discharge and monitoring plasma parameter


Spectrophotometer
- Device for measureing light intensity
- Measurement of intensity as a function of the light source wavelength (spectral bandwidth and linear range of absorption)


Thermal Properties Analyzer
- Transient line heat source method to measure thermal diffusivity, specific heat (heat capacity), thermal conductivity, and thermal resistivity


Centrifuge
- Isolation of small volumes of biological molecules or cells (prokaryotic and eukaryotic)